| 标题 |
Intensity corrections for grazing-incidence X-ray diffraction of thin films using static area detectors |
| 网址 | |
| DOI |
10.1107/s1600576724010628
doi
|
| 其它 |
期刊:Journal of Applied Crystallography 作者:Fabian Gasser; Josef Simbrunner; Marten Huck; Armin Moser; Hans-Georg Steinrück; et al 出版日期:2025-02-01 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)