| 标题 |
Synchrotron X-ray topography analysis of the distribution and formation mechanisms of low angle grain boundaries in PVT-Grown 4H-SiC crystal |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Crystal Growth 作者:Jianpei Zhang; Zeyu Chen; Yuzhuo Li; Shanshan Hu; Balaji Raghothamachar; et al 出版日期:2026-10-01 |
| 求助人 | |
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(2025-6-4)