| 标题 |
Study of the interfaces in resistive switching NiO thin films deposited by both ALD and e-beam coupled with different electrodes (Si, Ni, Pt, W, TiN) |
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| DOI | |
| 其它 |
期刊:Microelectronic Engineering 作者:Alessio Lamperti; Sabina Spiga; Hong-Liang Lü; Claudia Wiemer; Michele Perego; et al 出版日期:2008-10-03 |
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(2025-6-4)