| 标题 |
The development of a novel apparatus to measure the emissivity of high-roughness materials at 82 K |
| 网址 | |
| DOI | |
| 其它 |
期刊:Measurement Science and Technology 作者:Avijit Dewasi; Ranjana Gangradey; Samiran Shanti Mukherjee; Vishal Gupta; Rohan Dutta; et al 出版日期:2023 |
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(2025-6-4)