| 标题 |
A Perovskite/CMOS Integrated Image Sensor with Multispectral Response from Near-Infrared (850 nm) to X-Ray (40 keV) and Record Spatial Resolution |
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| DOI | |
| 其它 |
期刊:2025 IEEE International Electron Devices Meeting (IEDM) 作者:Pengju Tan; Shuo Yang; Tianyu Liu; Ying Meng; Sihui Yang; et al 出版日期:2025-12-06 |
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(2025-6-4)