| 标题 |
Reliable magnetometry for antiferromagnets and thin films: Correcting substrate artifacts in Mn 3 Sn / Mg O systems |
| 网址 | |
| DOI |
10.1103/wvr7-9s6r
doi
|
| 其它 |
期刊:Physical Review Applied 作者:Katarzyna Gas; Maciej Sawicki 出版日期:2026-01-06 |
| 求助人 | |
| 下载 |
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(2025-6-4)