| 标题 |
Mechanistic Understanding of Additive Reductive Degradation and SEI Formation in High‐Voltage NMC811||SiOx‐Containing Cells via Operando ATR‐FTIR Spectroscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced Energy Materials 作者:Matthias Weiling; Christian-Timo Lechtenfeld; Felix Pfeiffer; Lars Frankenstein; D. Diddens; et al 出版日期:2023-12-06 |
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(2025-6-4)