| 标题 |
Use of the concept of a quasi-solution to estimate the parameters of multilayer dielectric structures from the reflection characteristic measured on a network of discrete frequencies |
| 网址 | |
| DOI |
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| 其它 |
期刊:Russian Journal of Nondestructive Testing 作者:M. V. Andreev; V. Borulko; O. Drobakhin 出版日期:1996-01-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)