| 标题 |
Mobility Measurement and Degradation Mechanisms of MOSFETs Made With Ultrathin High-k Dielectrics |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Electron Devices 作者:W. Zhu; J.-P. Han; T.P. Ma 出版日期:2004-01-01 |
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(2025-6-4)