| 标题 |
Prediction of proton single event upset sensitivity based on heavy ion test data in nanometer hardened static random access memory |
| 网址 | |
| DOI | |
| 其它 |
期刊:Acta Physica Sinica 作者:Yin-Hong Luo; Feng-Qi Zhang; Hong-Xia Guo; Hajdas Wojtek 出版日期:2020 |
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