| 标题 |
 Secondary ion mass spectrometry–basic concepts, instrumental aspects, applications and trends. A. BENNINGHOVEN, F. G. RUDENAUER and H. W. WERNER, Wiley, New York, 1987, 1277 pages |
| 网址 | |
| DOI | |
| 其它 |
期刊：Surface and Interface Analysis 作者：J. C. Vickerman 出版日期：2005-05-28 |
| 求助人 | |
| 下载 |
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