| 标题 |
Study on dose reductions of organometal chemically amplified resists for sustainability of EUV lithography |
| 网址 | |
| DOI |
10.1117/12.3072198
doi
|
| 其它 |
期刊:International Conference on Extreme Ultraviolet Lithography 2025 作者:K. Machida; E. Satoshi; A. Konda; E. Nomura; T. Kozawa 出版日期:2025-11-06 |
| 求助人 | |
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(2025-6-4)