| 标题 |
Wavelet-based denoising of the Fourier metric in real-time wavefront correction for single molecule localization microscopy |
| 网址 | |
| DOI |
10.1117/12.2213531
doi
|
| 其它 |
期刊:SPIE Proceedings 作者:Kayvan Forouhesh Tehrani; Luke J. Mortensen; Peter Kner 出版日期:2016-03-15 |
| 求助人 | |
| 下载 |
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(2025-6-4)