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Interfacial reaction of In-Ag thermal interface materials with Ti/Ni/Ag backside chip metallization and its influence on thermal resistance |
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期刊:2026 IEEE 76th Electronic Components and Technology Conference (ECTC) 作者:Chun-En Lin; Polina Leger; Ke-Yen Ma; Anne Groth; Olaf Wittler; et al 出版日期:2026-05-26 |
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(2025-6-4)