| 标题 |
Device Reliability and Effect of Temperature on Memristors: Nanostructured V₂O₅ |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Device and Materials Reliability 作者:Sharmila B; Ashutosh Kumar Dikshit; Priyanka Dwivedi 出版日期:2024-04-24 |
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(2025-6-4)