| 标题 |
Deep Learning Enabled Measurements of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-Picometer Precision |
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| DOI | |
| 其它 |
期刊:Microscopy and Microanalysis 作者:Chia-Hao Lee; Chuqiao Shi; Di Luo; Abid Khan; Blanka E. Janicek; et al 出版日期:2019-08-01 |
| 求助人 | |
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(2025-6-4)