材料科学
三极管
离解(化学)
金属有机气相外延
光致发光
热的
范德瓦尔斯力
分析化学(期刊)
原位
纳米技术
光电子学
图层(电子)
物理化学
热力学
化学
有机化学
分子
物理
外延
作者
Cheolmin Park,Woonggi Hong,Sung‐Yool Choi
标识
DOI:10.1002/admi.202300135
摘要
Abstract Overcoming the thermal sensitivity of the van‐der Waals layered material, an inevitable high defect concentration in a large area (2 × 2 cm 2 ) vapor phase grown few‐layer MoS 2 (2.3 nm thick) is uniformly repaired over the entire area through thermal process. The defect concentration of the healed sample decreased by 3.8 times, and both the PL intensity and field‐effect mobility over the entire area increased by more than two times. Through observing in situ photoluminescence (PL) spectra with raising temperature, it is confirmed that the oxygen‐substitutional healing proceeds radically from the starting point at which trion dissociation energy is zero, inducing e–h plasma. At this time, for achieving successful healing of the entire area, immediate cooling is required to prevent accelerated oxidation when reaching the critical temperature. Considering the laboratory‐dependent crystalline quality of vapor‐phase grown transition metal dichalcogenides (TMDs), the methodology to find the optimal thermal healing temperature through in situ PL monitoring will be quite useful.
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