多铁性
材料科学
铁电性
薄膜
压电响应力显微镜
外延
极化(电化学)
应变工程
钙钛矿(结构)
凝聚态物理
扫描透射电子显微镜
化学计量学
纳米技术
结晶学
光电子学
透射电子显微镜
电介质
硅
化学
物理化学
物理
图层(电子)
作者
Panagiotis Koutsogiannis,P. A. Algarabel,J. A. Pardo,César Magén
出处
期刊:APL Materials
[American Institute of Physics]
日期:2024-01-01
卷期号:12 (1)
被引量:2
摘要
The physical properties of perovskite oxide thin films are governed by the subtle interplay between chemical composition and crystal symmetry variations, which can be altered by epitaxial growth. In the case of perovskite-type multiferroic thin films, precise control of stoichiometry and epitaxial strain allows for gaining control over the ferroic properties through selective crystal distortions. Here, we demonstrate the chemical tailoring of the polar atomic displacements by tuning the stoichiometry of multiferroic Sr1−xBaxMnO3−δ (0 ≤ x ≤ 0.5) epitaxial thin films. A combination of x-ray diffraction and aberration-corrected scanning transmission electron microscopy enables unraveling the local polarization orientation at the nanoscale as a function of the film’s composition and induced crystalline structure. We demonstrate experimentally that the orientation of polarization is intimately linked to the Ba doping and O stoichiometry of the films and, with the biaxial strain induced by the substrate, it can be tuned either in-plane or out-of-plane with respect to the substrate by the appropriate choice of the post-growth annealing temperature and O2 atmosphere. This chemistry-mediated engineering of the polarization orientation of oxide thin films opens new venues for the design of functional multiferroic architectures and the exploration of novel physics and applications of ferroelectric textures with exotic topological properties.
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