Design of AlN ultraviolet metasurface for single-/multi-plane holography

The metasurface promises an unprecedented way for manipulating wavefronts and has strengths in large information capacity for the hologram. However, strong absorption loss for most dielectric materials hinders the realization of such a metasurface operating in the ultraviolet (UV) spectrum. Herein, aluminum nitride (AlN) with an ultrawide bandgap has been utilized as the material of the UV metasurface for multi-plane holography, increasing the information capacity and security level of information storage simultaneously. The metasurface for multi-plane holography achieving a correlation coefficient of over 0.8 with three reconstructed images has been investigated, and also the single-plane holography at an efficiency of 34.05%. Our work might provide potential application in UV nanophotonics.