Thin Film Diagnostics With Surface Coherent Raman Scattering

We predict theoretically and verify experimentally that coherent Stokes (and anti-Stokes) Raman scattering is an efficient method for obtaining the Raman spectrum of a film, provided that the incident and scattered fields are guided by the film. Further calculations indicate that by using various combinations of guided wave modes it should be possible to locate impurities in a thin film.