FPGA-Based High-Speed Gray-Code Phase Shift Profilometry System

Phase-Shifting Profilometry (PSP) traditionally relies on multi-frequency phase unwrapping, which requires a large number of projection patterns and limits its applicability in high-speed industrial inspection. Furthermore, existing architectures cannot support real-time processing for dynamic 3-D reconstruction at a resolution of 2432×2048. We present an FPGA-based system that overcomes these limitations by employing a fast unwrapping method combined with algorithm-hardware co-design. A hybrid phase-shifting/Gray-code scheme is mapped onto a fully-pipelined datapath that incorporates two key optimizations: (i) logic-oriented phase quantization and additive decomposition that reduce resource utilization by 9.93%, and (ii) a high-speed buffering fabric that guarantees lossless data flow at 320 MHz. Operating at 64.1 fps, the prototype achieves less than 0.15 mm accuracy under dynamic experiments.The modular architecture scales to arbitrary objects and can be directly instantiated in high-speed structured-light metrology lines.