分辨率(逻辑)
电子显微镜
显微镜
常规透射电子显微镜
显微镜
微量分析
材料科学
扫描共焦电子显微镜
扫描电子显微镜
光学
纳米技术
扫描透射电子显微镜
计算机科学
化学
物理
人工智能
有机化学
标识
DOI:10.1080/00107518208237087
摘要
Abstract While high resolution electron microscopy has been in use for many years, with steadily improving image resolution, most modern microscopes can provide complementary information on the chemical composition of very small volumes of material. This advance is very important and enormously extends the range of practical applications for the electron microscope. This review describes the basic principles and techniques of high resolution imaging and analysis, in both the conventional and scanning electron microscope, noting in each case the resolution that may be achieved.
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