非阻塞I/O
X射线光电子能谱
镍
透射电子显微镜
电场
材料科学
化学物理
机制(生物学)
氧气
电子
离子
电阻式触摸屏
导电体
光谱学
凝聚态物理
分析化学(期刊)
纳米技术
化学
核磁共振
复合材料
冶金
物理
电气工程
生物化学
催化作用
有机化学
色谱法
量子力学
工程类
作者
Y. S. Chen,Jinfeng Kang,B. Chen,Bin Gao,L. F. Liu,X. Y. Liu,Y. Y. Wang,Lei Wu,Hongyu Yu,J. Y. Wang,Qing Chen,E. G. Wang
标识
DOI:10.1088/0022-3727/45/6/065303
摘要
Abstract A microscopic mechanism for the unipolar resistive switching phenomenon in nickel oxides is proposed based on the thermal decomposition of oxygen ions from oxygen-rich clusters and their recombination with electron-depleted vacancies induced by local electric field in conductive filaments. The proposed physical feature is confirmed by x-ray photoelectron spectroscopy, transmission electron microscopy and electrical measurements in the as-deposited NiO x samples. The deduced formulae under reasonable approximations directly demonstrate the relationships of switching parameters that were widely observed and questioned in different material systems, indicating the universal validity of the proposed mechanism.
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