Eccentricity corrections for a modified Debye–Scherrer camera

By substituting a thin flat powder specimen for the conventional cylindrical sample in a modified Debye–Scherrer camera [Frevel, DeLeeuw & Albe (1982). Norelco Rep. 29, 2, 38–39], well defined diffraction profiles representative of the entire sample are obtained. The peak of such a diffraction profile can be measured quite accurately so that for that reflection the effective center of the diffracting sample may be determined from the bracketing diffraction peaks of an internal standard.