与非门
闪光灯(摄影)
缩放比例
足迹
堆积
块(置换群论)
CMOS芯片
计算机科学
还原(数学)
电气工程
电子工程
光电子学
计算机硬件
逻辑门
材料科学
工程类
物理
数学
光学
生物
几何学
核磁共振
古生物学
出处
期刊:Electronics
[Multidisciplinary Digital Publishing Institute]
日期:2021-12-18
卷期号:10 (24): 3156-3156
被引量:74
标识
DOI:10.3390/electronics10243156
摘要
Since 3D NAND was introduced to the industry with 24 layers, the areal density has been successfully increased more than ten times, and has exceeded 10 Gb/mm2 with 176 layers. The physical scaling of XYZ dimensions including layer stacking and footprint scaling enabled the density scaling. Logical scaling has been successfully realized, too. TLC (triple-level cell, 3 bits per cell) is now the mainstream in 3D NAND, while QLC (quad-level cell, 4 bits per cell) is increasing the presence. Several attempts and partial demonstrations were made for PLC (penta-level cell, 5 bits per cell). CMOS under array (CuA) enabled the die size reduction and performance improvements. Program and erase schemes to address the technology challenges such as short-term data retention of the charge-trap cell and the large block size are being investigated.
科研通智能强力驱动
Strongly Powered by AbleSci AI