钻石
电场
击穿电压
肖特基二极管
肖特基势垒
材料科学
电流密度
二极管
光电子学
电压
分析化学(期刊)
化学
电气工程
复合材料
物理
量子力学
工程类
色谱法
作者
Qi Li,Shumiao Zhang,Guoqing Shao,Juan Wang,Ruozheng Wang,Qianwen Zhang,Genqiang Chen,Shi He,Shuwei Fan,Hongxing Wang
摘要
In this work, we fabricated a vertical diamond Schottky barrier diode (SBD) with a high breakdown electric field of 4.8 MV/cm and a forward current density of 2361 A/cm2. Compared with a regular diamond SBD, the breakdown electric field of SBD with a HfO2 field plate (FP) increased from 183 to 302 V, the current swing (ION/IOFF) was on the order of 1011. As the thickness of the HfO2 FP increased from 200 to 400 nm, the breakdown voltage of the SBD increased from 280 to 314 V, and the corresponding breakdown electric field increased from 4.5 to 5 MV/cm. We also measured the current–voltage characteristics at different temperatures to investigate the cause of the high on-resistance. As the measured temperature increased from 25 to 150 °C, the on-resistance of the device decreased from 4.7 to 1.7 mΩ·cm2. By studying the interface between HfO2 and the diamond, we found that HfO2 can reduce the interface state density of the Schottky contact. The interface state density of Zr/HfO2/diamond was lower than 1.5 × 1013 eV−1·cm−2. This work provides a simple strategy for realizing high-performance diamond SBDs.
科研通智能强力驱动
Strongly Powered by AbleSci AI