纳米颗粒
电介质
材料科学
光电子学
纳米技术
计算机科学
电子工程
工程物理
工程类
标识
DOI:10.1109/ectc.2008.4550055
摘要
Novel materials for embedded capacitor applications are in great demands, for which high dielectric constant (k), low dielectric loss and process compatibility with the printed circuit boards (PCBs) are the most important prerequisites. We have systematically investigated an efficient way to enhance the dielectric performance of the high-k nanocomposites by the selection of the appropriate filler, its size, size distribution, surface property and morphology (aggregation status).
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