光学
显微镜
分辨率(逻辑)
缩放比例
物理
图像分辨率
强度(物理)
点扩散函数
半最大全宽
量子
瑞利散射
数学
量子力学
人工智能
计算机科学
几何学
作者
Anton Classen,J. von Zanthier,Marlan O. Scully,G. S. Agarwal
出处
期刊:Optica
[Optica Publishing Group]
日期:2017-05-25
卷期号:4 (6): 580-580
被引量:77
标识
DOI:10.1364/optica.4.000580
摘要
We propose to use intensity correlation microscopy in combination with structured illumination to image quantum emitters that exhibit antibunching with a spatial resolution reaching far beyond the Rayleigh limit. Combining intensity measurements and intensity auto correlations up to order $m$ creates an effective PSF with FWHM shrunk by the factor $\sqrt{m}$. Structured Illumination microscopy on the other hand introduces a resolution improvement of factor 2 by use of the principle of moir\'e fringes. Here, we show that for linear low-intensity excitation and linear optical detection the simultaneous use of both techniques leads to an in theory unlimited resolution power with the improvement scaling favorably as $m + \sqrt{m}$ in dependence of the correlation order $m$. Hence, yielding this technique to be of interest in microscopy for imaging a variety of samples including biological ones. We present the underlying theory and simulations demonstrating the highly increased spatial superresolution, and point out requirements for an experimental implementation.
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