像素
暗电流
光电二极管
CMOS芯片
图像传感器
CMOS传感器
微透镜
灵敏度(控制系统)
动态范围
光电子学
信号(编程语言)
点间距
材料科学
光学
物理
电子工程
计算机科学
光电探测器
工程类
程序设计语言
镜头(地质)
作者
Shou-Gwo Wuu,Ho-Ching Chien,Dun-Nian Yaung,Chien-Hsien Tseng,C.S. Wang,Chin-Kung Chang,Yu-Kung Hsaio
标识
DOI:10.1109/iedm.2001.979567
摘要
A high performance 0.18 um CMOS image sensor technology has been successfully developed and fully characterized. 3T active pixel sensor (APS) with non-silicide source/drain process is provided to reduce dark current and increase photoresponse. By optimizing photodiode junction profile with the appropriate thermal cycle, the dark current can be drastically reduced. Small pixel pitch 2.8um/spl sim/4.0um demonstrates the low dark current (less 0.2 fA/pixel), the excellent sensitivity and dynamic range. Especially, the superior standard deviation of dark signal 8.3 mV/sec, will offer a low white pixel technology. The color pixel performance with microlens is also reported in this paper.
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