材料科学
微电子机械系统
碳化硅
高压
压力传感器
硅
碳化物
工程物理
纳米技术
光电子学
冶金
机械工程
工程类
作者
Renxing Wu,Chen Hui,Yichen Zhou,Yihao Guo,Zhangbin Ji,Long Li,Yuanfan Yang,Guoqiu Wang,Jian Zhou,YongQing Fu,Renxing Wu,Chen Hui,Yichen Zhou,Yihao Guo,Zhangbin Ji,Long Li,Yuanfan Yang,Guoqiu Wang,Jian Zhou,YongQing Fu
标识
DOI:10.1021/acsami.5c03045
摘要
High-temperature pressure sensors have recently attracted considerable interest for potential applications in the automotive, aerospace, and deep-well drilling industries, where they are required for monitoring gas or liquid pressures under extremely high temperatures and/or high pressures in harsh corrosive environments. Silicon carbide (SiC) is a third-generation semiconductor material with a wide band gap and excellent high-temperature stability and is regarded as a good candidate for overcoming the high-temperature intolerance of traditional pressure sensors. Currently, there are few reviews on recent advances in the synthesis, characterization, sensing mechanisms, design methodology, fabrication processes, operation, and application issues of SiC-based pressure sensors used under extreme application conditions. This review explores the following key topics: (i) key properties and special attributes of SiC materials; (ii) synthesis of SiC materials and thin films for high-temperature pressure sensor applications and processing of SiC materials, including etching, ohmic contacts, and bonding; (iii) recent development of SiC piezoresistive pressure sensors, including those based on silicon-on-insulator and all-SiC designs; (iv) recently reported SiC capacitive pressure sensors, including both 3C-SiC-based and all-SiC designs; and (v) advances in SiC-based fiber-optic pressure sensors. Finally, we highlight the key challenges and future prospects of next-generation SiC-based high-temperature pressure sensors.
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