材料科学
光刻胶
平版印刷术
光电子学
吸收(声学)
激光器
光学
激发
衍射
双光子激发显微术
纳米技术
荧光
图层(电子)
复合材料
工程类
物理
电气工程
作者
Joachim Fischer,Georg von Freymann,Martin Wegener
标识
DOI:10.1002/adma.201000892
摘要
Using a novel photoresist (composed of pentaerythritol triacrylate and isopropyl thioxanthone) that favors stimulated emission depletion by a π-π* transition and using a two-color two-photon excitation scheme, 65-nm wide lines are achieved. This value is limited by parasitic two-photon absorption of the continuous-wave depletion beam. It is estimated that, without this process, line widths of 30 nm are in reach.
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