High‐Voltage Induced Surface and Intragranular Structural Evolution of Ni‐Rich Layered Cathode

diffusion inside bulk material, resulting in kinetic limitation and capacity loss. The results demonstrate that the high-voltage cycling would induce severe structural degradation at the grain interior of the cathode material beyond surface evolution, which contributes significantly to the rapid performance decay of the NMC811 cathode. The findings provide new insights for developing effective countermeasures to mitigate this degradation pathway.