光学
平滑的
曲面(拓扑)
领域(数学)
暗场显微术
计算机科学
自适应光学
物理
计算机视觉
显微镜
几何学
数学
纯数学
作者
Chen Li,Yongying Yang,Huiting Chai,Yihui Zhang,Fan Wu,Lin Zhou,Kai Yan,Jian Bai,Yibing Shen,Qiao Xu,Hongzhen Jiang,Xu Liu
出处
期刊:Chinese Optics Letters
[Shanghai Institute of Optics and Fine Mechanics]
日期:2017-01-01
卷期号:15 (8): 081202-081202
被引量:18
标识
DOI:10.3788/col201715.081202
摘要
There exist some shallow scratch defects on the super-smooth optical surface. Their detection has a low efficiency with the existing technologies. So a new detection method, dark-field detection of adaptive smoothing and morphological differencing (DFD-ASMD), is proposed. On one hand, the information of shallow scratches can be kept in dark-field images. On the other hand, their weak characteristics can be separated and protected from being overly reduced during the elimination of noise and background in the image. Experiments show the detection rate of shallow scratches is around 82%, and DFD-ASMD can lay a foundation for quality control of defects on the high-quality optical surface.
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