肖特基势垒
半导体
凝聚态物理
电子
材料科学
肖特基二极管
偶极子
金属半导体结
金属
肖特基效应
矩形势垒
图层(电子)
光电子学
物理
纳米技术
量子力学
二极管
冶金
出处
期刊:Physical review
[American Physical Society]
日期:1992-06-15
卷期号:45 (23): 13509-13523
被引量:1493
标识
DOI:10.1103/physrevb.45.13509
摘要
A dipole-layer approach is presented, which leads to analytic solutions to the potential and the electronic transport at metal-semiconductor interfaces with arbitrary Schottky-barrier-height profiles. The presence of inhomogeneities in the Schottky-barrier height is shown to lead to a coherent explanation of many anomalies in the experimental results. These results suggest that the formation mechanism of the Schottky barrier is locally nonuniform at common, polycrystalline, metal-semiconductor interfaces.
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