绝缘体上的硅
材料科学
MOSFET
泊松方程
光电子学
电场
短通道效应
电压
硅
计算机科学
晶体管
电气工程
物理
工程类
量子力学
作者
Lei Cao,Hongxia Liu,Guanyu Wang
出处
期刊:Chinese Physics
[Science Press]
日期:2012-01-01
卷期号:61 (1): 017105-017105
被引量:1
标识
DOI:10.7498/aps.61.017105
摘要
In this paper,we propose a new device structure called HMG SSDOI (hetero-materiel gate strained Si directly on insulator), which combines the advantages of strained-silicon and hetero-material gate technology. By solving 2D Poisson's equation, we present models of the surface potential, surface electric field and threshold voltage for the new structure. These models take into account the effects of the gate length, the work function and the energy band. ISE TCAD is also used to simulate the performance of new device structure. The comparison results of model calculation and mathematic simulation show that the new structure of HMG SSDOI can enhance the carrier transport efficiency and suppress short channel effect, drain induction barrier lower and hot carrier effect, which improves device performance greatly.
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