等离子体
计算机科学
光学
材料科学
物理
核物理学
作者
Aneta Stodólna,Thomas Mechielsen,Peter van der Walle,Cederik Meekes,Henk A. Lensen
摘要
Inside Extreme Ultra Violet (EUV) lithography machines multiple scanner materials and components interact with the so-called EUV-generated hydrogen plasma. To gain knowledge about these interactions we conduct controlled experiments using laboratory setups at TNO, where selected properties of the EUV-generated plasma are mimicked. In this paper we present a novel plasma setup called EBR (Electron Beam Research), which uses an electron beam to generate a lowtemperature and high-flux hydrogen plasma. The properties of the e-beam generated plasma like ion flux, peak ion energy, radical-to-ion ratio are similar to the EUV-generated scanner plasma. Unlike any other plasma facility at TNO, the EBR setup can produce a pulsed plasma with a tunable pulse duration in 40 ns to 1s range at frequency varying from 1 Hz to 700 000 Hz. Thanks to that also the time-dependent behavior of the ion-flux from the scanner plasma is reproduced inside EBR for more realistic material and optics life-time testing.
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