A Reliability Evaluation Method for Multi-performance Degradation Products Based on Accelerated Degradation Testing
作者
Guangze Pan,Dan Li,Qian Li,Chuangmian Huang,Bing Mo
标识
DOI:10.1109/itaic54216.2022.9836924
摘要
Since the traditional reliability evaluation method cannot meet the development requirements of high reliability, long lifetime and complex products, a reliability evaluation method for multi-performance degradation products based on accelerated degradation testing (ADT) is proposed in this paper. By analyzing the degradation data of ADT, a single performance degradation model is established to evaluate the out-of-tolerance time of each performance parameter. Furthermore, by analyzing the competitive failure relationship of multi-performance parameters, a multi-performance degradation fusion model based on competitive failure is established to evaluate the out-of-tolerance time of performance parameters under accelerated stress of the product, and combine the acceleration factor to evaluate the reliability of the product under normal stress. Considering a certain type of integrated circuit equipment as an example to evaluate reliability, the evaluation results were found to be consistent with the actual results, thus indicating that the developed method achieves good accuracy and effectiveness.