薄脆饼
晶片键合
材料科学
过程(计算)
机械工程
失真(音乐)
电子工程
计算机科学
纳米技术
光电子学
工程类
放大器
CMOS芯片
操作系统
作者
Nathan Ip,Nima Nejadsadeghi,Carlos Fonseca,Norifumi Kohama,Kimio Motoda
出处
期刊:
日期:2022-05-01
卷期号:: 502-506
被引量:21
标识
DOI:10.1109/ectc51906.2022.00085
摘要
In semiconductor direct wafer bonding process, two silicon wafers are mechanically joined together by interfacial adhesion under room conditions. Accurate alignment between the two wafers along the bond interface is critical to achieve high device performances. This paper uses a coupled solid and fluid mechanics simulation model to study the wafer bonding dynamics. The results of this simulation model are studied in detail and compared against experimental data. This simulation model confirms the role of air viscosity in wafer bonding process. This model can help optimize key hardware features to improve process performance such as post-bond distortion.
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