相变存储器
非易失性存储器
材料科学
CMOS芯片
平版印刷术
纳米技术
计算机科学
集成电路
半导体
闪存
电子线路
非易失性随机存取存储器
半导体存储器
光电子学
电气工程
嵌入式系统
计算机硬件
计算机存储器
内存刷新
工程类
图层(电子)
作者
M.H.R. Lankhorst,Bas Ketelaars,R.A.M. Wolters
出处
期刊:Nature Materials
[Nature Portfolio]
日期:2005-03-13
卷期号:4 (4): 347-352
被引量:1093
摘要
Non-volatile 'flash' memories are key components of integrated circuits because they retain their data when power is interrupted. Despite their great commercial success, the semiconductor industry is searching for alternative non-volatile memories with improved performance and better opportunities for scaling down the size of memory cells. Here we demonstrate the feasibility of a new semiconductor memory concept. The individual memory cell is based on a narrow line of phase-change material. By sending low-power current pulses through the line, the phase-change material can be programmed reversibly between two distinguishable resistive states on a timescale of nanoseconds. Reducing the dimensions of the phase-change line to the nanometre scale improves the performance in terms of speed and power consumption. These advantages are achieved by the use of a doped-SbTe phase-change material. The simplicity of the concept promises that integration into a logic complementary metal oxide semiconductor (CMOS) process flow might be possible with only a few additional lithographic steps.
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