分子束外延
外延
兴奋剂
材料科学
基质(水族馆)
蒸发
薄膜
分析化学(期刊)
光电子学
化学
纳米技术
地质学
图层(电子)
物理
海洋学
热力学
色谱法
作者
X. M. Fang,Tanmay Chatterjee,P. J. McCann,W. K. Liu,M. B. Santos,W. Shan,J. J. Song
出处
期刊:Journal of vacuum science & technology
[American Institute of Physics]
日期:1996-05-01
卷期号:14 (3): 2267-2270
被引量:7
摘要
The growth of Eu-doped CaF2 and BaF2 thin films on Si(100), (110), and (111) substrates has been realized by molecular beam epitaxy using elemental Eu evaporation. Very bright blue emissions from Eu-doped CaF2 and yellow emissions from Eu-doped BaF2 were obtained in the wavelength range of 400–850 nm at 10 K. Depending on the Si substrate orientation, the zero-phonon line of Eu2+ in the CaF2 thin films was shifted by different amounts relative to that of bulk CaF2 due to residual strain in these epilayers.
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