材料科学
铟
无定形固体
薄膜晶体管
晶体管
光电子学
氧化物
原子层沉积
纳米技术
半导体
氧化物薄膜晶体管
工程物理
图层(电子)
电气工程
冶金
电压
工程类
有机化学
化学
作者
Adam Charnas,Zhuocheng Zhang,Zehao Lin,Dongqi Zheng,Jie Zhang,Mengwei Si,Peide D. Ye
标识
DOI:10.1002/adma.202304044
摘要
Amorphous oxide semiconductor transistors have been a mature technology in display panels for upward of a decade, and have recently been considered as promising back-end-of-line compatible channel materials for monolithic 3D applications. However, achieving high-mobility amorphous semiconductor materials with comparable performance to traditional crystalline semiconductors has been a long-standing problem. Recently it has been found that greatly reducing the thickness of indium oxide, enabled by an atomic layer deposition (ALD) process, can tune its material properties to achieve high mobility, high drive current, high on/off ratio, and enhancement-mode operation at the same time, beyond the capabilities of conventional oxide semiconductor materials. In this work, the history leading to the re-emergence of indium oxide, its fundamental material properties, growth techniques with a focus on ALD, state-of-the-art indium oxide device research, and the bias stability of the devices are reviewed.
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