材料科学
溅射沉积
带隙
开路电压
碳化硼
无定形固体
短路
薄膜
硼
电流密度
溅射
光电子学
电压
纳米技术
复合材料
化学
结晶学
电气工程
有机化学
量子力学
物理
工程类
作者
Tatsuya Nishida,Masayoshi Satō,Yoshiharu Enta,Yushi Suzuki,Yasuyuki Kobayashi,Hideki Nakazawa
标识
DOI:10.35848/1347-4065/ad13a2
摘要
Abstract In this study, amorphous boron carbide (B x C) and hydrogenated amorphous B x C (B x C:H) films were deposited via magnetron sputtering to investigate the effects of hydrogen on the film properties. The critical load decreased with increasing H 2 flow ratio, probably due to an increase in the internal stress. In addition, the optical bandgap increased with the H 2 flow ratio increased. The bandgap was controlled by the chemical bonding of carbon atoms and the chemical composition of films. The resistivity of the films increased with the H 2 flow ratio and bandgap energy. The current–voltage characteristics of B x C(:H)/n-type Si heterojunctions under white light illumination showed that the short-circuit current density and open-circuit voltage were higher than the previously reported values. Results revealed that the introduction of hydrogen during deposition reduced the short-circuit current density, fill factor, and conversion efficiency, whereas the open-circuit voltage remained almost unchanged.
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