Amorphous IGZO TFTs Featuring Extremely-Scaled Channel Thickness and 38 nm Channel Length: Achieving Record High Gm,max of 125 μS/μm at VDS of 1 V and ION of 350 μA/μm

We demonstrated amorphous indium-gallium-zinc-oxide thin film transistors (a-IGZO TFTs) with extremely scaled channel thickness t _a-IGZO of 3.6 nm, achieving low SS of 74.4 mV/decade and the highest μ _eff of 34 cm ² /V·s at carrier density N _carrier of ~5 × 10 ¹² cm ^-2 for a-IGZO TFTs having sub-10 nm t _a-IGZO . We found that there is no obvious degradation of mobility as t _a-IGZO changes from 6 nm to 3.6 nm. By scaling down the channel length LCH to 38 nm, the devices have shown the highest extrinsic transconductance (G _m ) of 125 μS/μm (at V _DS of 1 V) and the highest on-state current I _ON of 350 μA/μm at V _GS -V _T of 3.0 V and V _DS of 2.5 V for any kind of a-IGZO TFTs.