记忆电阻器
扩散
电子线路
电子工程
计算机科学
材料科学
光电子学
电气工程
物理
工程类
热力学
作者
Ying Zhao,Cong Fang,Qiang Li,Nianduan Lu,Feng Zhang,Ling Li,Ming Liu
标识
DOI:10.1109/sispad.2018.8551744
摘要
A compact model of memristor for unifying two switch characteristics, drift and diffusion has been proposed, based on the ion dynamic transport theory at the oxide interface layer. The model is verified by measured data in different oxide-material-based drift/diffusion memristors, and well fits DC/AC characteristics of both devices, under parameter variations and temperature evolution. Moreover, the applications of this model in neuron circuits design are shown.
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