前置放大器
JFET公司
跨阻放大器
硅光电倍增管
光电子学
电容
放大器
CMOS芯片
共栅
电气工程
物理
材料科学
晶体管
MOSFET
噪音(视频)
探测器
电阻器
寄生电容
带宽(计算)
电子工程
场效应晶体管
电阻式触摸屏
运算放大器
辐照
温度测量
Y系数
核电子学
测距
低温学
集成电路
电容器
低噪声放大器
硅
差分放大器
电压
温度系数
作者
Tom Klauner,Ottilie Bonfanti,Nicolas Roisin,Denis Flandre
标识
DOI:10.1109/tns.2026.3675060
摘要
A low-power, low-noise first-stage transimpedance amplifier (TIA) for silicon photomultiplier (SiPM) readout has been developed for harsh environments, targeting low Earth orbit (LEO) CubeSat applications. The circuit ensures reliable operation up to a total ionizing dose (TID) of 160 krad(SiO2) and with temperatures ranging from -55 °C to +125 °C. The TIA employs a folded-cascode architecture implemented in a 0.18 μm bulk CMOS process. It includes a low-voltage cascode bias circuit that is specifically designed to maintain functionality under shifts in the MOSFET electrical parameters induced by irradiation and temperature variations. This study combines simulation and experimental characterization to evaluate the readout performance of the TIA using a commercial Hamamatsu S13360-1375 SiPM. Under nominal conditions, the measured amplifier achieves a bandwidth of 4.6 MHz when connected to the SiPM, with a power consumption of 238 μW. The TIA also shows a measured input-referred noise of 61.0 nArmswhen connected to an optimal input capacitance of 12 pF. Measurements confirm that the readout operation is maintained without significant degradation after irradiation and across the full temperature range, validating its suitability for LEO applications.
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