, which effectively suppresses the surface carrier trap and leakage current and makes the surface potential uniform. At the same time, amino groups affect the growth of perovskite films, resulting in higher crystallinity, phase purity, and fewer defects. In addition, open-circuit photovoltage attenuation analysis (OCVD) tests show that the ion aggregation phenomenon of the device is weakened and ion migration is inhibited. TPC indicates a shortened recovery time constant, which may be due to reduced band bending at the interface, resulting in increased mobility of electron injection energy barriers. As a result, the PCE increased from 18.95 to 20.47% while exhibiting excellent stability.