材料科学
吞吐量
微观结构
纳米技术
计算机体系结构
系统工程
复合材料
计算机科学
工程类
电信
无线
作者
Markus Short,Jens Müller,S. Lee,H. Fornasier,U. Köhler,V. Ott,Michael Stüber,B. Gerdes,Trey D. Rupp,C. Kirchlechner,K. Woll
标识
DOI:10.1016/j.matdes.2023.111834
摘要
A new method applied to the sensor proposed by Zhang et al. in 2018 is demonstrated in this paper that combines the benefits of this design with the fast heating possible with nanocalorimetry. By applying a PID regulated pulse instead of a constant wattage, we unlock an accessible method to sense morphological changes occurring over short time periods that would be invisible to methods based only on heat capacity. In this study, multilayer Ni/Al thin films were linearly heated at 25, 50, 100, and 200 K/s to over 700°C, showing two distinct peaks in resistance change with activation energies of 554 and 747 kJ/mol, respectively. Through Scanning Transmission Electron Microscopy (STEM) and Energy Dispersive X-ray Analysis (EDX) analysis on cross sections taken ex situ from samples quenched before and after the peaks of interest, we find strong evidence that peak 1 corresponds to Ni diffusing through Al grain boundaries forming intermetallic phases that essentially block the highly conductive Al pathway. This presents the potential to design and calibrate novel heterogeneous structures in a high throughput manner.
科研通智能强力驱动
Strongly Powered by AbleSci AI