量子隧道
材料科学
凝聚态物理
电子
阻挡层
图层(电子)
电介质
隧道效应
矩形势垒
纳米技术
光电子学
物理
量子力学
作者
Yihao Wang,Qi Zhang,Jinling Zhou,Jiaolian Liu,Zhijun Ma,Peng Zhou,Tianjin Zhang,Nagarajan Valanoor
摘要
Tunneling behaviors of composite ferroelectric tunnel junctions (FTJs) with a no-polar dielectric (DE) layer thickness from 1 to 4 nm were investigated. It is found that the low-resistance state (ON state) current decreases with the DE thickness, while the high-resistance state (OFF state) current decreases first and then increases. The largest tunneling electroresistance (TER) effect is observed for the 3 nm-thick DE layer, which corresponds to the lowest OFF-state current. Studies on the electron transport mechanisms show that direct tunneling dominates the ON-state tunneling behaviors for all FTJs as well as the OFF state for the thinnest DE layer of 1 nm. While Fowler–Nordheim (FN) tunneling plays a significant role in the OFF-state electron transport for thicker DE thicknesses and reinforces its role with the increasing DE thickness, the weak FN tunneling-assisted low OFF-state current for the 3 nm-thick DE layer relative to the DE layer of 4 nm contributes to the largest TER effect.
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