电纳
有损压缩
电介质
波导管
光圈(计算机存储器)
厚板
导纳
微波食品加热
光学
微波成像
反问题
材料科学
数学分析
电阻抗
数学
声学
物理
计算机科学
工程类
光电子学
电气工程
电信
结构工程
统计
作者
Sasan Bakhtiari,Stoyan I. Ganchev,Reza Zoughi
摘要
Solutions for fields inside a slab of a generally lossy dielectric medium backed by a conducting plate, placed outside a waveguide-fed rectangular aperture, are used for the microwave nondestructive thickness measurement of such dielectric slabs. Upon construction of the waveguide terminating admittance expression from its variational form, an inverse problem is solved to extract the slab thickness form the conductance and susceptance in a recursive manner. A comparison between the experimental and theoretical results showed that the significance of higher order modes is minimal; hence, the dominant mode assumption is, in general, valid for describing the aperture field distribution. The validity of this assumption has led to the construction of a simple integral solution which is fast converging for generally lossy dielectric slabs, and may easily be implemented for real-time applications. Good agreement was obtained between the theoretical and experimental results. Multiple thicknesses of two different dielectric samples were estimated in this way.>
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