德拉姆
像素
动态范围
CMOS芯片
电容
图像传感器
电容器
光电二极管
点间距
浅沟隔离
高动态范围
光电子学
电气工程
材料科学
物理
光学
沟槽
电压
工程类
电极
图层(电子)
量子力学
复合材料
作者
Youngsun Oh,Lim Jungwook,Soeun Park,Dongsuk Yoo,Moosup Lim,Joongseok Park,Seojoo Kim,Minwook Jung,Sungkwan Kim,Junetaeg Lee,In-Gyu Baek,Kwangyul Ryu,Kyungmin Kim,Youngtae Jang,Min-Sun Keel,Gyu-Jin Bae,Seunghun Yoo,Youngkyun Jeong,Bumsuk Kim,JungChak Ahn
标识
DOI:10.1109/iedm45625.2022.10019558
摘要
This paper presents a CMOS image sensor with a $2.1\ \mu \mathrm{m}$ pixel for automotive applications. By using a sub-pixel structure and a high-capacity DRAM capacitor per pixel, a single exposure dynamic range achieves 140 dB at $85 ^{\circ}\mathrm{C}$, supporting LED flicker mitigation. Dual conversion gain circuits of a small photodiode enable SNR to stay above 23 dB at $105 ^{\circ}\mathrm{C}$ even with the very high capacitance. The full-depth deep trench isolation prevents electrical crosstalk between pixels even in extremely high illuminance conditions and achieves high conversion gain for low random noise of 0.83 e-.
科研通智能强力驱动
Strongly Powered by AbleSci AI